Revue J. Phys. I France Volume 1, Numéro 2, February 1991 Page(s) 167 - 174 DOI 10.1051/jp1:1991100

DOI: 10.1051/jp1:1991100

J. Phys. I France 1 (1991) 167-174

Tilt angle determinations in chiral and nonchiral smectic C phases using dielectric absorption spectroscopy

F. Gouda¹, K. Skarp¹, S.T. Lagerwall¹, C. Escher² and H. Kresse<sup>3

1</sup>  Physics Department, Chalmers University of Technology, S-412 96 Göteborg, Sweden
²  Hoechst AG, D-6230 Frankfurt 80, F.R.G.
³  Martin Luther Universität, Sektion Chemie, PSF, Halle D DR-4010, G.D.R.

(Received 19 September 1990, accepted in final form 26 November 1990)

Abstract
The temperature dependence of the tilt angle in the smectic C phase has been determined using a novel method based on dielectric absorption measurements in the smectic A and C phases, of both chiral and non-chiral compounds. The appropriate expressions for evaluating this tilt angle from dielectric absorption spectra are derived. The critical exponent for the tilt angle obtained by the dielectric method was found to be in good agreement with results from optical methods.

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