EDP Sciences logo
Authentification abonné
Rechercher
Menu

Article cité par

La fonctionnalité Article cité par… liste les citations d'un article. Ces citations proviennent de la base de données des articles de EDP Sciences, ainsi que des bases de données d'autres éditeurs participant au programme CrossRef Cited-by Linking Program. Vous pouvez définir une alerte courriel pour être prévenu de la parution d'un nouvel article citant " cet article (voir sur la page du résumé de l'article le menu à droite).

Article cité :

Statistical potentials from the Gaussian scaling behaviour of chain fragments buried within protein globules

Stefano Zamuner, Flavio Seno, Antonio Trovato and Jerome Baudry
PLOS ONE 17 (1) e0254969 (2022)
https://doi.org/10.1371/journal.pone.0254969

Spectroscopy and Dynamics of Single Molecules

Kumuditha M. Weerakoon-Ratnayake, Swarnagowri Vaidyanathan, Charuni A. Amarasekara, Carey K. Johnson and Steven A. Soper
Spectroscopy and Dynamics of Single Molecules 335 (2019)
https://doi.org/10.1016/B978-0-12-816463-1.00007-9

Structural-temporal approach for dynamic strength characterization of gabbro-diabase

Y. Petrov, A. Bragov, A. Evstifeev, E. Cadoni and E. Cadoni
EPJ Web of Conferences 94 01042 (2015)
https://doi.org/10.1051/epjconf/20159401042

Spalling uniaxial strength of Al2O3 at high strain rates

M. J. Pérez-Martín, B. Erice, D. A. Cendón and F. Gálvez
The European Physical Journal Special Topics 206 (1) 117 (2012)
https://doi.org/10.1140/epjst/e2012-01593-3

High-speed deformation and fracture of the dioxide-zirconium ceramics and zirconium alumina concrete

A. Bragov, L. Kruszka, A. Lomunov, et al.
EPJ Web of Conferences 26 01055 (2012)
https://doi.org/10.1051/epjconf/20122601055

Hopkinson Bar Loaded Fracture Experimental Technique: A Critical Review of Dynamic Fracture Toughness Tests

Fengchun Jiang and Kenneth S. Vecchio
Applied Mechanics Reviews 62 (6) (2009)
https://doi.org/10.1115/1.3124647

Comparison of the stability of blends of chemically identical and different homopolymers in the bulk and in a film

Marios K. Kosmas and Costas H. Vlahos
The Journal of Chemical Physics 119 (7) 4043 (2003)
https://doi.org/10.1063/1.1591720

The influence of Ge grading on the bias and temperature characteristics of SiGe HBTs for precision analog circuits

S.L. Salmon, J.D. Cressler, R.C. Jaeger and D.L. Harame
IEEE Transactions on Electron Devices 47 (2) 292 (2000)
https://doi.org/10.1109/16.822270

Neutral base recombination and its influence on the temperature dependence of Early voltage and current gain-Early voltage product in UHV/CVD SiGe heterojunction bipolar transistors

A.J. Joseph, J.D. Cressler, D.M. Richey, R.C. Jaeger and D.L. Harame
IEEE Transactions on Electron Devices 44 (3) 404 (1997)
https://doi.org/10.1109/16.556150