Article cité par

La fonctionnalité Article cité par… liste les citations d'un article. Ces citations proviennent de la base de données des articles de EDP Sciences, ainsi que des bases de données d'autres éditeurs participant au programme CrossRef Cited-by Linking Program. Vous pouvez définir une alerte courriel pour être prévenu de la parution d'un nouvel article citant " cet article (voir sur la page du résumé de l'article le menu à droite).

Article cité :

Electrostatic forces between a metallic tip and semiconductor surfaces

S. Hudlet, M. Saint Jean, B. Roulet, J. Berger, C. Guthmann

J. Phys. I France, 4 11 (1994) 1725-1742

DOI: https://doi.org/10.1051/jp1:1994217

Citations de cet article :

Mechanical energy dissipation of an oscillating cantilever close to a conductive substrate partly covered with thin mica films evaluated by frequency modulation atomic force microscopy

Md Mahamudul Hasan, Toyoko Arai and Masahiko Tomitori
Japanese Journal of Applied Physics 61 (6) 065006 (2022)
https://doi.org/10.35848/1347-4065/ac6b02

Electrostatic tip effects in scanning probe microscopy of nanostructures

Clayton B Casper, Earl T Ritchie, Taylor S Teitsworth, et al.
Nanotechnology 32 (19) 195710 (2021)
https://doi.org/10.1088/1361-6528/abde63

A review of advanced scanning probe microscope analysis of functional films and semiconductor devices

Günther Benstetter, Roland Biberger and Dongping Liu
Thin Solid Films 517 (17) 5100 (2009)
https://doi.org/10.1016/j.tsf.2009.03.176

Nanoscale determination of surface orientation and electrostatic properties of ZnO thin films

J. Zúñiga-Pérez, E. Palacios-Lidón, V. Muñoz-Sanjosé and J. Colchero
Applied Physics A 88 (1) 77 (2007)
https://doi.org/10.1007/s00339-007-3944-6

Kelvin probe force microscopy – An appropriate tool for the electrical characterisation of LED heterostructures

W. Bergbauer, T. Lutz, W. Frammelsberger and G. Benstetter
Microelectronics Reliability 46 (9-11) 1736 (2006)
https://doi.org/10.1016/j.microrel.2006.07.064

Measurements of electric potential in a laser diode by Kelvin Probe Force Microscopy

G Lévêque, P Girard, E Skouri and D Yarekha
Applied Surface Science 157 (4) 251 (2000)
https://doi.org/10.1016/S0169-4332(99)00535-8

Image charges revisited: Beyond classical electrostatics

Bernard Roulet and Michel Saint Jean
American Journal of Physics 68 (4) 319 (2000)
https://doi.org/10.1119/1.19433

Observation of surface potential at nanometer scale by electrostatic force microscopy (EFM) with large signals

G Leveque, J Bonnet, A Tahraoui and P Girard
Materials Science and Engineering: B 51 (1-3) 197 (1998)
https://doi.org/10.1016/S0921-5107(97)00259-6

Charge dynamics and time evolution of contact potential studied by atomic force microscopy

M. Saint Jean, S. Hudlet, C. Guthmann and J. Berger
Physical Review B 56 (23) 15391 (1997)
https://doi.org/10.1103/PhysRevB.56.15391

Electrostatic forces between metallic tip and semiconductor surfaces

S. Hudlet, M. Saint Jean, B. Roulet, J. Berger and C. Guthmann
Journal of Applied Physics 77 (7) 3308 (1995)
https://doi.org/10.1063/1.358616