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A Reflection Electron Microscopy Investigation of the Divergence of the Mean Correlated Difference of Step Displacements on a Si(111) Vicinal Surface

J.C. Heyraud, J.M. Bermond, C. Alfonso, J.J. Métois

J. Phys. I France, 5 4 (1995) 443-449

DOI: https://doi.org/10.1051/jp1:1995137

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