A Reflection Electron Microscopy Investigation of the Divergence of the Mean Correlated Difference of Step Displacements on a Si(111) Vicinal Surface J.C. Heyraud, J.M. Bermond, C. Alfonso et J.J. MétoisJ. Phys. I France, 5 4 (1995) 443-449DOI: https://doi.org/10.1051/jp1:1995137
