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Cited article:

Etude théorique de l'interaction de van der Waals entre une sonde métallique et une surface diélectrique : application à la microscopie par mesure de forces atomiques

S. Maghezzi, C. Girard, D. Van Labeke

J. Phys. I France, 1 2 (1991) 289-307

DOI: https://doi.org/10.1051/jp1:1991132

This article has been cited by the following article(s):

Mapping van der Waals forces with frequency modulation dynamic force microscopy

J Polesel-Maris, H Guo, T Zambelli and S Gauthier
Nanotechnology 17 (16) 4204 (2006)
https://doi.org/10.1088/0957-4484/17/16/034

Scanning force microscopy simulations of well-characterized nanostructures on dielectric and semiconducting substrates

F. Touhari, X. Bouju, Ch. Girard, M. Devel and G. Cohen-Solal
Applied Surface Science 125 (3-4) 351 (1998)
https://doi.org/10.1016/S0169-4332(97)00504-7

Image simulation of a corrugated surface in the constant-force-gradient mode of the scanning force microscope

F Touhari-Kouko, X Bouju, M Devel and G Cohen-Solal
Journal of Physics D: Applied Physics 31 (19) 2388 (1998)
https://doi.org/10.1088/0022-3727/31/19/005