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Cited article:
N. R. J. Poolton , Y. Cros
J. Phys. I France, 1 9 (1991) 1335-1345
This article has been cited by the following article(s):
8 articles
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Combined AFM and confocal fluorescence microscope for applications in bio‐nanotechnology
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Exoelectron emission studies of trap spectrum in ultrathin amorphous Si3N4 films
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Auger mechanism of exoelectron emission in dielectrics with high electron affinity
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Exoelectron emission spectroscopy of silicon nitride thin films
G. Rosenman, M. Naich, M. Molotskii, Yu. Dechtiar and V. Noskov Applied Physics Letters 80 (15) 2743 (2002) https://doi.org/10.1063/1.1469656
Strong Visible Photoluminescence in Silicon Nitride thin Films Deposited at High Rates
Sadanand V. Deshpande, Erdogan Gulari, Steven W. Brown and S.C. Rand MRS Proceedings 325 (1993) https://doi.org/10.1557/PROC-325-177
Photoluminescence in Nitrogen-Rich a-SiNx:H
D. Chen, J.M. Viner, P.C. Taylor and J. Kanicki MRS Proceedings 258 (1992) https://doi.org/10.1557/PROC-258-661