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Cited article:

Zn-related center in silicon : negative-U properties

N. T. Bagraev

J. Phys. I France, 2 10 (1992) 1907-1920

DOI: https://doi.org/10.1051/jp1:1992254

This article has been cited by the following article(s):

C,H,N and O in Si and Characterization and Simulation of Materials and Processes

S.E. Daly, E. McGlynn, M.O. Henry, et al.
C,H,N and O in Si and Characterization and Simulation of Materials and Processes 116 (1996)
https://doi.org/10.1016/B978-0-444-82413-4.50031-7

The complexing of oxygen with the Group II impurities Be, Cd and Zn in silicon

S.E. Daly, E. McGlynn, M.O. Henry, et al.
Materials Science and Engineering: B 36 (1-3) 116 (1996)
https://doi.org/10.1016/0921-5107(95)01290-7