Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

Integrated nanosecond laser full-field imaging for femtosecond laser-generated surface acoustic waves in metal film-glass substrate multilayer materials

Yannis Orphanos, Kyriaki Kosma, Evaggelos Kaselouris, et al.
Applied Physics A 125 (4) (2019)
https://doi.org/10.1007/s00339-019-2552-6

Quantitative study of buried heat sources by lock-in vibrothermography: an approach to crack characterization

A Mendioroz, E Apiñaniz, A Salazar, P Venegas and I Sáez-Ocáriz
Journal of Physics D: Applied Physics 42 (5) 055502 (2009)
https://doi.org/10.1088/0022-3727/42/5/055502

Invited Review Article: Microwave spectroscopy based on scanning thermal microscopy: Resolution in the nanometer range

Ralf Meckenstock
Review of Scientific Instruments 79 (4) (2008)
https://doi.org/10.1063/1.2908445

Piezoelectric and pyroelectric study of Zn[sub 1-x-y]Be[sub x]Mn[sub y]Se mixed crystals

J. Zakrzewski, F. Firszt, S. Legowski, et al.
Review of Scientific Instruments 74 (1) 566 (2003)
https://doi.org/10.1063/1.1515896

The effect of annealing on the photoacoustic and photothermal response of Al2O3-SiC-TiC ceramics with internal stresses

K. L. Muratikov, A. L. Glazov, V. I. Nikolaev, D. N. Rose and D. E. Dumar
Technical Physics Letters 27 (6) 500 (2001)
https://doi.org/10.1134/1.1383838

Low temperature thermal diffusivity measurements of gases by the mirage technique

A. Salazar and A. Sánchez-Lavega
Review of Scientific Instruments 70 (1) 98 (1999)
https://doi.org/10.1063/1.1149548

Noncontacting measurement of thickness of thin titanium silicide films using spectroscopic ellipsometer

S. Kal, I. Kasko and H. Ryssel
IEEE Electron Device Letters 19 (4) 127 (1998)
https://doi.org/10.1109/55.663536