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Cited article:
A. Gibaud , J. Wang , M. Tolan , G. Vignaud , S.K. Sinha
J. Phys. I France, 6 8 (1996) 1085-1094
Accepted: 1996-04-25
This article has been cited by the following article(s):
6 articles
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J. P. Morgan, C. J. Kinane, T. R. Charlton, et al. AIP Advances 2 (2) (2012) https://doi.org/10.1063/1.4732147
Characterization of the nanostructures of a lithographically patterned dot array by x-ray pseudo-Kossel lines
D. R. Lee, Y. S. Chu, Y. Choi, et al. Applied Physics Letters 82 (6) 982 (2003) https://doi.org/10.1063/1.1543249
Effects of partial coherence on the scattering of x rays by matter
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Determination of micrometer length scales with an X-ray reflection ultra small-angle scattering set-up
P Müller-Buschbaum, M Casagrande, J Gutmann, et al. Europhysics Letters (EPL) 42 (5) 517 (1998) https://doi.org/10.1209/epl/i1998-00282-0
Reconstruction of surface morphology from coherent x-ray reflectivity
I. A. Vartanyants, J. A. Pitney, J. L. Libbert and I. K. Robinson Physical Review B 55 (19) 13193 (1997) https://doi.org/10.1103/PhysRevB.55.13193