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Cited article:

Atomic force microscopy study of the growth and annealing of Ge islands on Si(100)

Bing Liu, Cindy L. Berrie, Takeshi Kitajima, John Bright and Stephen R. Leone
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 20 (2) 678 (2002)
https://doi.org/10.1116/1.1459724