J. Phys. I France
Volume 1, Numéro 2, February 1991
Page(s) 167 - 174
DOI: 10.1051/jp1:1991100

J. Phys. I France 1 (1991) 167-174

Tilt angle determinations in chiral and nonchiral smectic C phases using dielectric absorption spectroscopy

F. Gouda1, K. Skarp1, S.T. Lagerwall1, C. Escher2 and H. Kresse3

1  Physics Department, Chalmers University of Technology, S-412 96 Göteborg, Sweden
2  Hoechst AG, D-6230 Frankfurt 80, F.R.G.
3  Martin Luther Universität, Sektion Chemie, PSF, Halle D DR-4010, G.D.R.

(Received 19 September 1990, accepted in final form 26 November 1990)

The temperature dependence of the tilt angle in the smectic C phase has been determined using a novel method based on dielectric absorption measurements in the smectic A and C phases, of both chiral and non-chiral compounds. The appropriate expressions for evaluating this tilt angle $\theta$ from dielectric absorption spectra are derived. The critical exponent for the tilt angle obtained by the dielectric method was found to be in good agreement with results from optical methods.

© Les Editions de Physique 1991

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