| Issue |
J. Phys. I France
Volume 1, Number 2, February 1991
|
|
|---|---|---|
| Page(s) | 167 - 174 | |
| DOI | https://doi.org/10.1051/jp1:1991100 | |
DOI: 10.1051/jp1:1991100
J. Phys. I France 1 (1991) 167-174
1 Physics Department, Chalmers University of Technology, S-412 96 Göteborg, Sweden
2 Hoechst AG, D-6230 Frankfurt 80, F.R.G.
3 Martin Luther Universität, Sektion Chemie, PSF, Halle D DR-4010, G.D.R.
© Les Editions de Physique 1991
J. Phys. I France 1 (1991) 167-174
Tilt angle determinations in chiral and nonchiral smectic C phases using dielectric absorption spectroscopy
F. Gouda1, K. Skarp1, S.T. Lagerwall1, C. Escher2 and H. Kresse31 Physics Department, Chalmers University of Technology, S-412 96 Göteborg, Sweden
2 Hoechst AG, D-6230 Frankfurt 80, F.R.G.
3 Martin Luther Universität, Sektion Chemie, PSF, Halle D DR-4010, G.D.R.
(Received 19 September 1990, accepted in final form 26 November 1990)
Abstract
The temperature dependence of the tilt angle in the smectic C phase has been determined using a novel method based on dielectric
absorption measurements in the smectic A and C phases, of both chiral and non-chiral compounds. The appropriate expressions
for evaluating this tilt angle
from dielectric absorption spectra are derived. The critical exponent for the tilt angle obtained by the dielectric method
was found to be in good agreement with results from optical methods.
© Les Editions de Physique 1991