Issue |
J. Phys. I France
Volume 6, Number 12, December 1996
|
|
---|---|---|
Page(s) | 2043 - 2050 | |
DOI | https://doi.org/10.1051/jp1:1996202 |
DOI: 10.1051/jp1:1996202
J. Phys. I France 6 (1996) 2043-2050Scaling in Angle Resolved Electrical Transport Measurements on
S. Friemel, C. Pasquier and D. Jérome
Laboratoire de Physique des Solides URA 2 CNRS, Université Paris-Sud, 91405 Orsay Cedex, France
(Received 7 May 1996, received in final form 14 June 1996, accepted 17 June 1996)
© Les Editions de Physique 1996
J. Phys. I France 6 (1996) 2043-2050
Scaling in Angle Resolved Electrical Transport Measurements on
-(BEDT-TTF)
Cu(NCS)
S. Friemel, C. Pasquier and D. Jérome Laboratoire de Physique des Solides URA 2 CNRS, Université Paris-Sud, 91405 Orsay Cedex, France
(Received 7 May 1996, received in final form 14 June 1996, accepted 17 June 1996)
Abstract
We report on single crystal electrical transport measurements on
-(BEDT-TTF)
2Cu(NCS)
2 in an external magnetic field applied at different angles with respect to the superconducting layers. By measuring the in-plane
resistivity versus temperature we can reveal a thermally activated behavior in the vortex liquid phase and are able to extract the angular dependence
of the activation energy. Voltage versus current measurements lead to angle dependent values for the critical current
. Our data can be fitted succesfully within the framework of the anisotropic effective mass model resulting in an estimate
for the anisotropy parameter
.
© Les Editions de Physique 1996