J. Phys. I France
Volume 2, Numéro 6, June 1992
Page(s) 1043 - 1050
DOI: 10.1051/jp1:1992113
J. Phys. I France 2 (1992) 1043-1050

X-ray absorption near edge structure of quartz. Application to the structure of densified silica

P. Lagarde1, A. M. Flank1, G. Tourillon1, R. C. Liebermann2 and J. P. Itie3

1  LURE (CNRS, CEA, MENJS) Bât. 209d, Centre Universitaire, 91405 Orsay, France
2  Center for High Pressure Research, State University of New York, Stony Brook, New York 11794, U.S.A.
3  Physique des Milieux Condensés, Université P. et M. Curie, 4 place Jussieu, 75230 Paris Cedex 05, France

(Received 20 January 1992, revised and accepted 19 March 1992)

X-ray absorptions spectra of quartz ( $10\bar 1 0$), pure silica and densified silica under pressure have been recorded at the silicon and oxygen K-edges. The spectra of quartz show intense polarization effects which have been interpreted on the single scattering approximation, using geometrical considerations. The comparison between the spectra of silica and densified silica, on the basis of this interpretation, gives some information on the structural effect suffered by the silica network under pressure.

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