J. Phys. I France
Volume 1, Numéro 12, December 1991
Page(s) 1669 - 1673
DOI: 10.1051/jp1:1991234
J. Phys. I France 1 (1991) 1669-1673

High precision measurement of the SOS surface thickness in the rough phase

Hans Gerd Evertz1, Martin Hasenbusch2, Mihail Marcu3, 4, Klaus Pinn5 and Sorin Solomon6

1  Supercomputer Computations Research Institute, Florida State University, Tallahassee, FL32306, U.S.A.
2  Fachbereich Physik, Universität Kaiserslautern, Postfach 3049, D-6750 Kaiserslautern, Germany
3  II. Institut für Theoretische Physik, Universität Hamburg, Luruper Chaussee 149, D-2000 Hamburg 50, Germany
4  School of Physics and Astronomy, Raymond and Beverly Sackler Faculty of Exact Sciences, Tel Aviv University, 69978 Tel Aviv, Israel
5  Institut für Theoretische Physik I, Universität Münster, Wilhelm-Klemm-Str.9, D-4400 Münster, Germany
6  Racah Institute of Physics, Hebrew University, 91904 Jerusalem, Israel

(Received 26 September 1991, accepted 7 October 1991)

Using a cluster algorithm without critical slowing down for the discrete Gaussian SOS model, we verify to high precision the linear dependence of the surface thickness on the logarithm of the lattice size.

© Les Editions de Physique 1991

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