Numéro |
J. Phys. I France
Volume 4, Numéro 6, June 1994
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Page(s) | 947 - 973 | |
DOI | https://doi.org/10.1051/jp1:1994238 |
J. Phys. I France 4 (1994) 949-973
Growth roughness and instabilities due to the Schwoebel effect : a one-dimensional model
Ilya Elkinani and Jacques VillainCEA, Département de Recherche Fondamentale sur la Matière Condensée, SPSMS, MDN, CENG, 17 rue des Martyrs, F-38054 Grenoble Cedex 9, France
(Received 3 January 1994, accepted 14 February 1994)
Abstract
A very simple, one-dimensional model ("Zeno model") of crystal growth
by molecular beam epitaxy is studied numerically. The essentiel feature
of the Zeno model is that it takes into account the asymetry of
the sticking coefficient of adatoms to steps (Schwoebel effect), i.e.,
the diffusiog atoms stick preferably to the upper ledge. In contrast with
other, more microscopie descriptions, the Zeno model takes the diffusion
of adatoms into account through a deterministic diffusion equation, so
that the computing time is greatly reduced and a systematic investigation
of the effect of the different parameters is possible. Deep cracks form
even for a weak Schwoebel effect, but they form after a time which is very
long if the Schwoebel effect is very weak. In certain cases, the roughness
increases proportionally to time, in agreement with experiments on silicon
and with other calculations. In the absence of Schwoebel effect, surface
defects are healed during growth.
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